Papers (more than 50):
- M. Glumova Statistical simulation of cathodes in electronic vacuum devices. Proc. Inter. Autumn School-Conference for Young Scientists. "Solid State Physics: Fundamentals & Application". - Uzhgorod (Ukraine). - Kiev. - 1994. - p. 93-95.
- M. Glumova Microgun simulation Proc. Inter. Autumn School-Conference for Young Scientists. "Solid State Physics: Fundamentals & Application" - Uzhgorod (Ukraine). - Kiev. - 1995. - p. 71-73.
- M. Glumova Numerical investigation of noise of electron beams in the gun region. Proc. Inter. School-Conference for Young Scientists SSPFA-97 Katsyveli, (Crimea, Ukraine) - Kiev - 1997 - p. 34-36.
- M.Glumova, V. Starostenko, Ye. Taran, Ye. Grygoriev Influence of Electromagnetic Fields on Integrated Microcircuit 14th International Wroclaw Symposium and Exhibition on Electromagnetic Compatibility, Wroclaw, 1998, p. 362-365.
- M.Glumova, V. Starostenko, Ye. Taran, Ye. Grygoriev Dynamics of Degradation Processes in Metallization of Integrated Microcircuits Under the Influence of Electromagnetic Fields 14th International Wroclaw Symposium and Exhibition on Electromagnetic Compatibility, Wroclaw, 1998, - p. 366-370.
- Marina V. Glumova, Valeri Z Lozovski, Dmitry V Reznik
Surface waves on a superconductor: beyond the weak-coupling approximation Journal of Physics: Condensed Matter - 2002. - 14. - c. 4271-4285.
- Glumova M.V. Vorobyov M.D., Starostenko V.V. The development and investigation of a Numerical Dynamic model of Vacuum-tube Devices Telecommunications and Radio Engineering, 56 (1-2), 2002, 126-133.
- Marina V. Glumova, Valeri Z. Lozovski, Dmitry V. Reznik Surface waves on a strong - coupling superconductor Proceeding of SPIE, vol 4938, 2002, - pp. 67-75.
- Marina V. Glumova, Valeri Z. Lozovski, Dmitry V. Reznik, Sergey F. Lemeshenko
Dispersion relations of the electromagnetic waves in the strong-coupling superconducting pad on the dielectric substrate Proc. Int. conf. "Spectroscopy of molecules and crystals", 21.05.2003 - 29.05.2003.
- М. В. Глумова, М. Д. Воробьев, Д.Н. Юдаев, Я. Г. Анджело //Proc. International Seminar Noise and degradation processes in semiconductor devices. 27-29 November 2006, Moscow, pp 34-38.
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